Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
View larger
ISO/TS 22933:2022
M00007686
New product
ISO/TS 22933:2022 Surface chemical analysis - Secondary ion mass spectrometry - Method for the measurement of mass resolution in SIMS
standard by International Organization for Standardization (Technical Standard), 04/01/2022
In stock
More info
Full Description
This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.