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IEC 63275-2 Ed. 1.0 b:2022

M00007817

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IEC 63275-2 Ed. 1.0 b:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation

standard by International Electrotechnical Commission, 05/01/2022

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This part of IEC 63275 gives the test method and a procedure using this method to evaluate the on-state voltage change, on-state resistance change and reverse drain voltage change of silicon carbide (SiC) power MOSFET devices due to body diode operation. This test is not generally requested for Si power transistors.

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Edition: 1.0 Published: 05/01/2022 ISBN(s): 9782832201213 Number of Pages: 24 File Size: 1 file , 900 KB Note: This product is unavailable in Belarus, Russia, Ukraine