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BS PD IEC/TR 63133:2017
New product
BS PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices
standard by BSI Group, 01/29/2018
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Full Description
BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.Cross References:
IEEE 1149.1:2013
All current amendments available at time of purchase are included with the purchase of this document.