> IEC 60749-43 Ed. 1.0 b:2017
Sale! View larger

IEC 60749-43 Ed. 1.0 b:2017

New product

IEC 60749-43 Ed. 1.0 b:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

standard by International Electrotechnical Commission, 06/15/2017

More details

$101.05

-57%

$235.00

More info

Full Description

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Product Details

Edition: 1.0 Published: 06/15/2017 Number of Pages: 74File Size: 1 file , 1.1 MB