IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
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Edition: 1.0 Published: 10/24/2011 Number of Pages: 96File Size: 1 file , 1.6 MB