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IEC 62415 Ed. 1.0 b:2010

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IEC 62415 Ed. 1.0 b:2010 Semiconductor devices - Constant current electromigration test

standard by International Electrotechnical Commission, 05/19/2010

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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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Edition: 1.0 Published: 05/19/2010 Number of Pages: 22File Size: 1 file , 910 KB