Full Description

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

Product Details

Edition: 1.0 Published: 11/07/2007 Number of Pages: 123File Size: 1 file , 1.5 MB