Sale! View larger

IEC 61164 Ed. 2.0 en:2004

New product

IEC 61164 Ed. 2.0 en:2004 Reliability growth - Statistical test and estimation methods

standard by International Electrotechnical Commission, 03/24/2004

More details

$104.49

-57%

$243.00

More info

Full Description

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

Product Details

Edition: 2.0 Published: 03/24/2004 Number of Pages: 55File Size: 1 file , 780 KB