> IEC 60749-7 Ed. 1.0 b:2002 [ Withdrawn ]
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IEC 60749-7 Ed. 1.0 b:2002 [ Withdrawn ]

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IEC 60749-7 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

standard by International Electrotechnical Commission, 04/09/2002

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Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

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Edition: 1.0 Published: 04/09/2002 Number of Pages: 15File Size: 1 file , 430 KB