Full Description

This part of IEC 61788 is applicable to the measurement of the dark count rate (DCR, RD) of superconductor strip photon detectors (SSPDs). It specifies terms, definitions, symbols and the measurement method of DCR that depends on the bias current (Ib) and operating temperature (T).

NOTE The data of measurement results in Annex A are based on measurements of one institute only. The standard will be updated after the data of a complete round robin test are available.