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ISO 24173:2009
M00006224
New product
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
standard by International Organization for Standardization, 09/01/2009
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Full Description
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.