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ISO 18452:2005

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ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

standard by International Organization for Standardization, 11/15/2005

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ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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Published: 11/15/2005 File Size: 1 file , 240 KB Same As: DIN EN ISO 18452, BS EN ISO 18452:2016